Properties and applications of new silicon drift detectors and multiple element silicon drift detectors

Microscopy and Microanalysis

Volumn 10, Issue SUPPL. 2, 2004, Pages 942-943

  Terborg, Ralf ^a   Rohde, Martin ^a  

^a R NTEC GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4544293190     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604881510     Document Type: Conference Paper

References (3)

1. R. Terborg, M. Rohde, Microsc. Microanal. 9 (Suppl.2) Proceedings (2003), 120
2. R. Hartmann et al., Nucl. Instr. and Meth. A 377 (1996) 191
3. F. Scholze, M. Procop, X-ray Spectrom. 30 (2001) 69