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Volumn 33, Issue 4, 2008, Pages 442-463

On using stochastic curtailment to shorten the SPRT in sequential mastery testing

Author keywords

Computerized adaptive testing; Sequential mastery testing; Stochastic curtailment; Variable length testing

Indexed keywords


EID: 49549086562     PISSN: 10769986     EISSN: None     Source Type: Journal    
DOI: 10.3102/1076998607308573     Document Type: Article
Times cited : (28)

References (21)
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  • 15
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.