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Volumn 15, Issue 4, 2008, Pages 1144-1152

A new dielectric response model for water tree degraded XLPE insulation - Part B: Dielectric response interpretation

Author keywords

Conductivity; Cross linked polyethylene insulation; Dielectric loss; Dielectric measurements; Finite element method; Frequency domain spectroscopy; Nonlinearities; Space charge; Water trees

Indexed keywords

CABLES; DEGRADATION; DISTRIBUTED POWER GENERATION; ELECTRIC GENERATORS; ELECTRIC TRANSFORMERS; FINITE ELEMENT METHOD; FORECASTING; FREQUENCY DOMAIN ANALYSIS; OFFSHORE OIL WELL PRODUCTION; PAPER; SULFATE MINERALS;

EID: 49449100277     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2008.4591237     Document Type: Article
Times cited : (26)

References (8)
  • 3
    • 0032179515 scopus 로고    scopus 로고
    • Understanding water treeing mechanisms in the development of diagnostic test methods
    • S. Hvidsten, E. Ildstad, J. Sletbak, and H. Faremo, "Understanding water treeing mechanisms in the development of diagnostic test methods", IEEE Trans. Dielectr. Electr. Insul., Vol. 5, pp. 754-760, 1998.
    • (1998) IEEE Trans. Dielectr. Electr. Insul , vol.5 , pp. 754-760
    • Hvidsten, S.1    Ildstad, E.2    Sletbak, J.3    Faremo, H.4
  • 5
    • 49449085963 scopus 로고    scopus 로고
    • A theoretical investigation for the development of a water tree dielectric response model
    • Kansas City
    • A. J. Thomas and T.K. Saha, "A theoretical investigation for the development of a water tree dielectric response model", IEEE Conf. Electr. Insul. Dielectr. Phenomena, pp. 368-372 ,Kansas City, 2006.
    • (2006) IEEE Conf. Electr. Insul. Dielectr. Phenomena , pp. 368-372
    • Thomas, A.J.1    Saha, T.K.2
  • 6
    • 0031622324 scopus 로고    scopus 로고
    • Water causing a nonlinear dielectric response of water treed XLPE characterized by FTIR microspectrometry
    • ISEI, Arlington, USA, pp
    • S. Hvidsten and E. Ildstad, "Water causing a nonlinear dielectric response of water treed XLPE characterized by FTIR microspectrometry", IEEE Intern. Sympos. Electr. Insul. (ISEI), Arlington, USA, pp. 101-104, 1998.
    • (1998) IEEE Intern. Sympos. Electr. Insul , pp. 101-104
    • Hvidsten, S.1    Ildstad, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.