SCOPUS 정보 검색 플랫폼

Journal of Crystal Growth

Volumn 271, Issue 1-2, 2004, Pages 29-36

Microstructural characterization of HgTe/HgCdTe superlattices

(8) Aoki, T a Takeguchi, M a Boieriu, P b Singh, R b Grein, C b Chang, Y c Sivananthan, S c Smith, David J a

a ARIZONA STATE UNIVERSITY (United States)

b EPIR TECHNOLOGIES INC (United States)

c UNIVERSITY OF ILLINOIS AT CHICAGO (United States)

Author keywords

A1. Characterization; A1. Diffusion; A1. Interface; A3. Molecular beam epitaxy; B2. Semiconducting mercury compounds; B3. Infrared device

Indexed keywords

ACTIVATION ANALYSIS; ANNEALING; DEFECTS; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); MERCURY COMPOUNDS; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY;

FOCAL PLANE ARRAYS (FPA); MID-WAVELENGTH INFRARED (MWIR) WAVELENGTH; SEMICONDUCTING MERCURY COMPOUNDS; WELL/BARRIER INTERFACES;

SUPERLATTICES;

EID: 4944250306 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.07.055 Document Type: Article

Times cited : (7)

References (17)

1
- 0033714321
- C.A. Cabelli, D.E. Cooper, A. Haas, L.J. Kozlowski, G. Bostrup, A.C. Chen, J.D. Blackwell, J.T. Montroy, K. Vural, W.E. Kleinhans, K.W. Hodapp, D. Hall, Proc. SPIE 4028 (2000) 331.
- (2000) Proc. SPIE , vol.4028 , pp. 331
- Cabelli, C.A.¹ Cooper, D.E.² Haas, A.³ Kozlowski, L.J.⁴ Bostrup, G.⁵ Chen, A.C.⁶ Blackwell, J.D.⁷ Montroy, J.T.⁸ Vural, K.⁹ Kleinhans, W.E.¹⁰ Hodapp, K.W.¹¹ Hall, D.¹²

2
- 0035761799
- A.L. Betz, R.T. Boreiko, Proc. SPIE 4454 (2001) 1.
- (2001) Proc. SPIE , vol.4454 , pp. 1
- Betz, A.L.¹ Boreiko, R.T.²

3
- 0043269256
- Y.D. Zhou, C.R. Becker, Y. Selamet, Y. Chang, R. Ashokan, R.T. Boreiko, T. Aoki, D.J. Smith, A.L. Betz, S. Sivananthan, J. Electron. Mater. 32 (2003) 608.
- (2003) J. Electron. Mater. , vol.32 , pp. 608
- Zhou, Y.D.¹ Becker, C.R.² Selamet, Y.³ Chang, Y.⁴ Ashokan, R.⁵ Boreiko, R.T.⁶ Aoki, T.⁷ Smith, D.J.⁸ Betz, A.L.⁹ Sivananthan, S.¹⁰

4
- 84886677203
- Australia
- A. Rogalski, Infrared Detectors, Gordon and Breach Science, Australia, 2000.
- (2000) Infrared Detectors, Gordon and Breach Science
- Rogalski, A.¹

5
- 0008447669
- Kluwer Academic Publishers, Boston
- P. Capper, C.T. Elliot, Infrared Detectors and Emitters: Materials and Devices, Kluwer Academic Publishers, Boston, 2001.
- (2001) Infrared Detectors and Emitters: Materials and Devices
- Capper, P.¹ Elliot, C.T.²

6
- 0010754527
- J.N. Schulman, T.C. MCGill, Appl. Phys. Lett. 34 (1979) 663.
- (1979) Appl. Phys. Lett. , vol.34 , pp. 663
- Schulman, J.N.¹ McGill, T.C.²

7
- 1842417404
- K.A. Harris, T.H. Myers, R.W. Yanka, L.M. Mohnkern, N. Otsuka, J. Vac. Sci. Technol. B 9 (1991) 1752.
- (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 1752
- Harris, K.A.¹ Myers, T.H.² Yanka, R.W.³ Mohnkern, L.M.⁴ Otsuka, N.⁵

8
- 4544307453
- K.A. Harris, S. Hwang, D.K. Blanks, J.W. Cook Jr., J.F. Shetzina, N. Otsuka, J.P. Baukus, A.T. Hunter, Appl. Phys. Lett. 48 (1986) 393.
- (1986) Appl. Phys. Lett. , vol.48 , pp. 393
- Harris, K.A.¹ Hwang, S.² Blanks, D.K.³ Cook Jr., J.W.⁴ Shetzina, J.F.⁵ Otsuka, N.⁶ Baukus, J.P.⁷ Hunter, A.T.⁸

9
- 84913066380
- J.P. Baukus, A.T. Hunter, O.J. Marsh, C.E. Jones, G.Y. Wu, S.R. Hetzler, T.C. MCGill, J.P. Faurie, J. Vac. Sci. Technol. A 4 (1986) 2110.
- (1986) J. Vac. Sci. Technol. A , vol.4 , pp. 2110
- Baukus, J.P.¹ Hunter, A.T.² Marsh, O.J.³ Jones, C.E.⁴ Wu, G.Y.⁵ Hetzler, S.R.⁶ McGill, T.C.⁷ Faurie, J.P.⁸

10
- 0000073381
- M. Zandian, A.C. Chen, D.D. Edwall, J.G. Pasko, J.M. Arias, Appl. Phys. Lett. 71 (1997) 2815.
- (1997) Appl. Phys. Lett. , vol.71 , pp. 2815
- Zandian, M.¹ Chen, A.C.² Edwall, D.D.³ Pasko, J.G.⁴ Arias, J.M.⁵

11
- 0000179675
- P. Capper, J. Vac. Sci. Technol. B 2 (1991) 1667.
- (1991) J. Vac. Sci. Technol. B , vol.2 , pp. 1667
- Capper, P.¹

12
- 0027647077
- S.H. Shin, J.M. Arias, M. Zandian, J.G. Pasko, L.O. Bubulac, R.E. De Wames, J. Electron. Mater. 22 (1993) 1039.
- (1993) J. Electron. Mater. , vol.22 , pp. 1039
- Shin, S.H.¹ Arias, J.M.² Zandian, M.³ Pasko, J.G.⁴ Bubulac, L.O.⁵ De Wames, R.E.⁶

13
- 0346306324
- Y. Chang Y, G. Badano, J. Zhao, C.H. Grein, S. Sivananthan, T. Aoki, D.J. Smith, Appl. Phys. Lett. 83 (2003) 4785.
- (2003) Appl. Phys. Lett. , vol.83 , pp. 4785
- Chang, Y.¹ Badano, Y.G.² Zhao, J.³ Grein, C.H.⁴ Sivananthan, S.⁵ Aoki, T.⁶ Smith, D.J.⁷

14
- 0012271509
- Oxford University Press, New York, Chapter 6
- M. Fox, Optical Properties of Solids, Oxford University Press, New York, 2001, pp. 115-141, Chapter 6.
- (2001) Optical Properties of Solids , pp. 115-141
- Fox, M.¹

15
- 0026202777
- S.J. Pennycook, D.E. Jesson, Ultramicroscopy 37 (1991) 14.
- (1991) Ultramicroscopy , vol.37 , pp. 14
- Pennycook, S.J.¹ Jesson, D.E.²

16
- 0023263893
- E. Kirkland, R.F. Loane, J. Silcox, Ultramicroscopy 23 (1987) 77.
- (1987) Ultramicroscopy , vol.23 , pp. 77
- Kirkland, E.¹ Loane, R.F.² Silcox, J.³

17
- 0011975450
- S. Hwang, Y. Lansari, Z. Yang, J.W. Cook Jr., J.F. Schetzina, J. Vac. Sci. Technol. B 9 (1991) 1799.
- (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 1799
- Hwang, S.¹ Lansari, Y.² Yang, Z.³ Cook Jr., J.W.⁴ Schetzina, J.F.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.