Characterization of AlON-TiON stacked insulators for ZnS:Mn thin film electroluminescent devices

Electrochemical and Solid-State Letters

Volumn 7, Issue 9, 2004, Pages

  Lim, Jung Wook ^a   Sun, Jin Yun ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHEMICAL VAPOR DEPOSITION; ELECTRIC POTENTIAL; LUMINESCENT DEVICES; PERMITTIVITY; THIN FILMS;

ATOMIC LAYER DEPOSITION (ALD); THIN FILM ELECTROLUMINESCENT (TFEL) DEVICES;

ELECTRIC INSULATORS;

EID: 4944239580     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1773754     Document Type: Article

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