An optimization model for selective inspection in serial manufacturing systems

International Journal of Production Research

Volumn 42, Issue 18, 2004, Pages 3891-3909

  Kakade, Vivek ^a   Valenzuela, Jorge F ^a   Smith, Jeffrey S ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA REDUCTION; HEURISTIC METHODS; INSPECTION; INTEGER PROGRAMMING; MATHEMATICAL MODELS; OPTIMIZATION; PRINTED CIRCUIT BOARDS; PRODUCT DEVELOPMENT; RESOURCE ALLOCATION; SEMICONDUCTOR DEVICE MANUFACTURE;

AUTOMATED VISUAL INSPECTION (AVI); INSPECTION ALLOCATION MODELS; MULTI-STAGE ASSEMBLY LINE; SERIAL MANUFACTURING SYSTEMS;

COMPUTER AIDED MANUFACTURING;

EID: 4944237419     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207540410001704014     Document Type: Article

References (14)

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