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Volumn 96, Issue 5, 2004, Pages 2423-2427

Effect of outermost layers on resonant cavity enhanced devices

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; DENSE WAVELENGTH DIVISION MULTIPLEXING; ELECTROMAGNETIC WAVE REFLECTION; ETCHING; FABRICATION; MICROELECTROMECHANICAL DEVICES; MIRRORS; OPTICAL INTERCONNECTS; PHASE SHIFT; PHOTODETECTORS; QUANTUM EFFICIENCY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SILICON WAFERS;

EID: 4944227192     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1775302     Document Type: Article
Times cited : (6)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.