Optimal film thickness for exciton diffusion length measurement by photocurrent response in organic heterostructures

Thin Solid Films

Volumn 516, Issue 21, 2008, Pages 7701-7707

  Yang, Li Gong ^a,b   Chen, Hong Zheng ^a,b,c   Wang, Mang ^a,c  

^a ZHEJIANG UNIVERSITY   (China)

^b Zhejiang California International NanoSystems Institute   (China)

^c ZHEJIANG UNIVERSITY   (China)

Author keywords

Exciton diffusion length; Organic heterojunctions; Photocurrent modeling

Indexed keywords

COPPER; CORRELATION METHODS; CRYSTALS; CURVE FITTING; DIFFUSION; ESTIMATION; EXCITONS; HETEROJUNCTIONS; MAGNETIC FILMS; NUMERICAL ANALYSIS; OPTICAL CORRELATION; ORGANIC POLYMERS; PHOTOCURRENTS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DOPING; THICKNESS MEASUREMENT;

BI LAYERS; COPPER PHTHALOCYANINE; DIFFUSION LENGTHS; EXCITON DIFFUSION; EXCITON DIFFUSION LENGTH; FILM-THICKNESS; HETEROSTRUCTURES; INTRINSIC NONLINEARITY; MEASUREMENT ACCURACY; OPTICAL INTERFERENCES; OPTIMAL FILM THICKNESS; OPTIMAL THICKNESS; ORGANIC HETEROJUNCTIONS; ORGANIC LAYERS; ORGANIC MATERIALS; ORGANIC PHOTOVOLTAIC DEVICES; PAPER ADDRESSES; PHOTO-CURRENT RESPONSE; PHOTOCURRENT MODELING; PHOTOCURRENT SPECTRUM; THICKNESS EFFECTS;

UNCERTAINTY ANALYSIS;

EID: 49349117902     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.03.027     Document Type: Article

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