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IEEE Aerospace Conference Proceedings

Volumn , Issue , 2008, Pages

Managing and predicting intermittent failures within lone life electronics

(2) Line, J Kevin a Krishnan, Ganapathi a

a VEXTEC Corporation (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN-TEST; CIRCUIT CONFIGURATIONS; DEGRADED FAILURES; DESIGN CYCLES; DIAGNOSTICS AND PROGNOSTICS; DIFFERENT OPERATING CONDITIONS; ELECTRONIC COMPONENTS; ELECTRONIC SYSTEMS; HIGH-RELIABILITY; INDIVIDUAL COMPONENTS; INTERMITTENT FAILURE; MATERIAL CHANGES; PROGNOSTICS AND HEALTH MANAGEMENT; SELF-COMPENSATION; STANDARD LIBRARIES; TROUBLE SHOOTING;

AUTOMOBILE PARTS AND EQUIPMENT; DIAMONDS; ELECTRIC CURRENTS; ELECTRONICS ENGINEERING; FAILURE ANALYSIS; FIGHTER AIRCRAFT; HEALTH RISKS; MAINTENANCE; PROBABILITY; QUALITY ASSURANCE; RANDOM PROCESSES; RELIABILITY; REPAIR; STANDARDS; SULFATE MINERALS; SUPPLY CHAINS;

AUTOMOBILE ELECTRONIC EQUIPMENT;

EID: 49349109144 PISSN: 1095323X EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/AERO.2008.4526629 Document Type: Conference Paper

Times cited : (6)

References (8)

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2
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