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Volumn , Issue , 2008, Pages

Power conversion prognostic controller implementation for aeronautical motor drives

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; DETERIORATION; DRIVES; ELECTRIC DRIVES; ELECTROMAGNETISM; MECHANISMS; MICROCONTROLLERS; MODELS; TEMPERATURE;

EID: 49349088161     PISSN: 1095323X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AERO.2008.4526630     Document Type: Conference Paper
Times cited : (2)

References (7)
  • 2
    • 0004043346 scopus 로고
    • Laidler, K. J, Oxford University Press
    • The World of Physical Chemistry, Laidler, K. J. (1993) Oxford University Press.
    • (1993) The World of Physical Chemistry
  • 3
    • 3142678981 scopus 로고    scopus 로고
    • Temperature dependency of MOSFET device characteristics in 4H- and 6H-silicon carbide (SiC), Elsevier; Md. Hasanuzzaman, Syed K. Islam, Leon M. Tolbert Mohammad T. Alam, Solid-State Electronics 48 (2004) 1877-1881, Department of Electrical and Computer Engineering, The University of Tennessee.
    • "Temperature dependency of MOSFET device characteristics in 4H- and 6H-silicon carbide (SiC)", Elsevier; Md. Hasanuzzaman, Syed K. Islam, Leon M. Tolbert Mohammad T. Alam, Solid-State Electronics 48 (2004) 1877-1881, Department of Electrical and Computer Engineering, The University of Tennessee.
  • 4
    • 49349107895 scopus 로고    scopus 로고
    • Silicon Carbide Vertical Junction Field Effect Transistors Operated at Junction Temperatures Exceeding 300° C, J. N. Merrett, W. A. Draper, J.R.B. Casady, J. B. Casady, I. Sankin, R. Kelley SemiSouth Laboratories Inc., V. Bondarenko, M. Mazzola, D. Seale Mississippi State University, Department of Electrical and Computer Engineering.
    • "Silicon Carbide Vertical Junction Field Effect Transistors Operated at Junction Temperatures Exceeding 300° C", J. N. Merrett, W. A. Draper, J.R.B. Casady, J. B. Casady, I. Sankin, R. Kelley SemiSouth Laboratories Inc., V. Bondarenko, M. Mazzola, D. Seale Mississippi State University, Department of Electrical and Computer Engineering.
  • 5
    • 49349087922 scopus 로고    scopus 로고
    • High-Temperature Static and Dynamic Reliability Study of 4H-SiC Vertical-Channel JFETs for High-Power System Applications, L. Cheng, P. Martin, M. Mazzola, D. Sheridan, R. Kelly, V. Bondarenko, R. Gray, G. Tian, J. Scofield, J. R. B. Casady & J. B. Casady, International Conference on Silicon Carbide and Related Materials (ICSCRM) 2007, Oct. 14-19, 2007
    • "High-Temperature Static and Dynamic Reliability Study of 4H-SiC Vertical-Channel JFETs for High-Power System Applications", L. Cheng, P. Martin, M. Mazzola, D. Sheridan, R. Kelly, V. Bondarenko, R. Gray, G. Tian, J. Scofield, J. R. B. Casady & J. B. Casady, International Conference on Silicon Carbide and Related Materials (ICSCRM) 2007, Oct. 14-19, 2007
  • 6
    • 49349115261 scopus 로고    scopus 로고
    • Fast Thermal Modeling of Power Semiconductor Devices using Fourier Techniques, J.J. Nelson, G. Venkataramana, A.M. El-Refaie, University of Wisconsin-Madison.
    • "Fast Thermal Modeling of Power Semiconductor Devices using Fourier Techniques", J.J. Nelson, G. Venkataramana, A.M. El-Refaie, University of Wisconsin-Madison.
  • 7
    • 49349088641 scopus 로고    scopus 로고
    • Pulse-by-Pulse Predictive Current Control
    • B. Borowy & L. Casey, "Pulse-by-Pulse Predictive Current Control", IEEE APEC 2006.
    • (2006) IEEE APEC
    • Borowy, B.1    Casey, L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.