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Volumn 155, Issue 9, 2008, Pages

Characterization of threading dislocations in thin germanium layers by defect etching: Toward chromium and HF-free solution

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; CRYSTALLINE MATERIALS; ETCHING; GERMANIUM; HYDROFLUORIC ACID;

EID: 49149131360     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2953495     Document Type: Article
Times cited : (21)

References (11)
  • 1
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    • MSSPFQ 1369-8001 10.1016/j.mss2006.08.039.
    • A. N. Larsen, Mater. Sci. Semicond. Process. MSSPFQ 1369-8001 10.1016/j.mssp.2006.08.039, 9, 454 (2006).
    • (2006) Mater. Sci. Semicond. Process. , vol.9 , pp. 454
    • Larsen, A.N.1
  • 3
    • 0017491527 scopus 로고
    • JESOAN 0013-4651 10.1149/1.2133401, ()
    • M. W. Jenkins, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2133401, 124, 757 (1977)
    • (1977) J. Electrochem. Soc. , vol.124 , pp. 757
    • Jenkins, M.W.1
  • 8
    • 0018439616 scopus 로고
    • JESOAN 0013-4651 10.1149/1.2129066.
    • D. G. Schimmel, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2129066, 126, 479 (1979).
    • (1979) J. Electrochem. Soc. , vol.126 , pp. 479
    • Schimmel, D.G.1
  • 9
    • 84951050944 scopus 로고
    • JESOAN 0013-4651 10.1149/1.2404374.
    • F. Secco d'Aragona, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2404374, 119, 948 (1972).
    • (1972) J. Electrochem. Soc. , vol.119 , pp. 948
    • Secco D'Aragona, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.