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Volumn 3094, Issue , 1997, Pages 250-254

Characterization of thin metal films with overlayers by transparency and multiangle including surface plasmon excitation reflectance ellipsometry method

Author keywords

Ag; Au; Corrosion; Ellipsometry; GaAs; InP; Intrinsic oxide; Surface plasmons; Thin films; Transparency

Indexed keywords

CORROSION; ELLIPSOMETRY; GALLIUM ALLOYS; GOLD; METALLIC FILMS; OPTICAL CONSTANTS; OPTICAL DATA STORAGE; OXIDE FILMS; OXIDE MINERALS; PLASMONS; POLARIMETERS; QUARTZ; REFLECTION; SEMICONDUCTING GALLIUM; THIN FILMS; TRANSPARENCY;

EID: 49149105868     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.271822     Document Type: Conference Paper
Times cited : (2)

References (7)
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    • N.L.Dmitruk, O.V.Fursenko, O.Yu.Borkovskaya, "Optical properties of the optoelectronic structures metal-semiconductor with tunnel-thin transitional dielectric layer", Optoelektron. Poluprovodn. Tekh.(Kiev) 27, 115-121 (1994).
  • 2
    • 0030083183 scopus 로고    scopus 로고
    • N.L.Dmitruk, O.Yu.Borkovskaya, O.I.Mayeva and O.V.Fursenko Polarization-sensitive photocurrents of metal-semiconductor structures with flat and microrelief interfaces, Microelectr. Journ. 27(1), 37-42 (1996).
    • N.L.Dmitruk, O.Yu.Borkovskaya, O.I.Mayeva and O.V.Fursenko "Polarization-sensitive photocurrents of metal-semiconductor structures with flat and microrelief interfaces", Microelectr. Journ. 27(1), 37-42 (1996).
  • 3
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  • 5
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  • 7
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    • Optical properties of extremely thin films: Studies using ATR techniques
    • Jing-Jiang Xu and Jin-Fa Tang, "Optical properties of extremely thin films: studies using ATR techniques", Applied Optics 28(14), 2925-2928 (1989).
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    • Xu, J.-J.1    Tang, J.-F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.