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Volumn 3094, Issue , 1997, Pages 250-254
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Characterization of thin metal films with overlayers by transparency and multiangle including surface plasmon excitation reflectance ellipsometry method
a a a |
Author keywords
Ag; Au; Corrosion; Ellipsometry; GaAs; InP; Intrinsic oxide; Surface plasmons; Thin films; Transparency
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Indexed keywords
CORROSION;
ELLIPSOMETRY;
GALLIUM ALLOYS;
GOLD;
METALLIC FILMS;
OPTICAL CONSTANTS;
OPTICAL DATA STORAGE;
OXIDE FILMS;
OXIDE MINERALS;
PLASMONS;
POLARIMETERS;
QUARTZ;
REFLECTION;
SEMICONDUCTING GALLIUM;
THIN FILMS;
TRANSPARENCY;
AG;
AU;
GAAS;
INP;
INTRINSIC OXIDE;
SURFACE PLASMONS;
SILVER;
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EID: 49149105868
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.271822 Document Type: Conference Paper |
Times cited : (2)
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References (7)
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