Comparative study of the luminescence properties of Er-, Nd- and Tm-doped Si-ZrO2 CO-sputtered films

Journal of Physics Condensed Matter

Volumn 20, Issue 31, 2008, Pages

  Rozo, C ^a   Fonseca, L F ^a  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; ERBIUM; LIGHT; LIGHT EMISSION; LUMINESCENCE; NEODYMIUM; SILICON; SURFACE DEFECTS; THICK FILMS; X RAY ANALYSIS; ZIRCONIA;

CHEMICAL COMPOSITIONS; CO-SPUTTERING; COMPARATIVE STUDIES; DOPED SAMPLES; DOPED SI; LUMINESCENCE PROPERTIES; NANOPARTICLE SURFACES; PHOTOLUMINESCENCE MEASUREMENTS; THIN FILM SAMPLES; VISIBLE RANGE; X-RAY DIFFRACTION;

YTTRIA STABILIZED ZIRCONIA;

EID: 49149105104     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/20/31/315003     Document Type: Article

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