Effect of end-substitutions of distyryl-oligothiophenes by hexyl chains on environmental stability in organic thin film transistors

Organic Electronics

Volumn 9, Issue 5, 2008, Pages 591-601

  Videlot Ackermann, C ^a   Brisset, H ^a   Ackermann, J ^a   Zhang, J ^a   Raynal, P ^a   Fages, F ^a   Mehl, G H ^b   Tnanisawa, T ^c   Yoshimoto, N ^c  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b UNIVERSITY OF HULL   (United Kingdom)

^c IWATE UNIVERSITY   (Japan)

Author keywords

Oligothiophene derivative; Organic semiconductor; Organic thin film transistor; Stability

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL SENSORS; CONVERGENCE OF NUMERICAL METHODS; CYCLIC VOLTAMMETRY; DIFFERENTIAL SCANNING CALORIMETRY; FIELD EFFECT TRANSISTORS; HOLE MOBILITY; LIGHT ABSORPTION; LIQUID CRYSTALS; OPTICAL FILMS; PHOTOLUMINESCENCE SPECTROSCOPY; PHOTOTRANSISTORS; SEMICONDUCTING FILMS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM CIRCUITS; THIN FILMS; THRESHOLD VOLTAGE; X RAY DIFFRACTION;

ATMOSPHERIC CONDITIONS; ENVIRONMENTAL STABILITY; OLIGOTHIOPHENE DERIVATIVE; OPTICAL POLARISING MICROSCOPY; ORGANIC THIN FILM TRANSISTOR (OTFTS); ORGANIC THIN FILM TRANSISTORS; SEMICONDUCTING LAYER; SOLID-STATE PROPERTIES;

THIN FILM TRANSISTORS;

EID: 49049102497     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2008.03.007     Document Type: Article

References (26)

1. Murphy A.R., and Fréchet J.M.J. Chem. Rev. 107 (2007) 1066
2. For a recent account on organic electronics, see the special issue of Chemistry of Materials, Chem. Mater. 16(23) 2004.
3. Dimitrakopoulos C.D., and Malefant P.R.L. Adv. Mater. 14 (2002) 99
4. Sirringhaus H., Tessler N., and Friend R.H. Sciences 280 (1998) 1741
5. Sirringhaus H., Tessler N., and Friend R.H. Synth. Met. 102 (1999) 857
6. Sheraw C.D., Zhou L., Huang J.R., Gundlach D.J., Jackson T.N., Kane M.G., Hill I.G., Hammond M.S., Campi J., Greening B.K., Francl J., and West J. Appl. Phys. Lett. 80 (2002) 1088
7. Fix W., Ullmann A., Ficker J., and Clemens W. Appl. Phys. Lett. 81 (2002) 1735
8. Videlot-Ackermann C., Ackermann J., Brisset H., Kawamura K., Yoshimoto N., Raynal P., El Kassmi A., and Fages F. J. Am. Chem. Soc. 127 (2005) 16346
9. Belluci C., Gualtieri F., and Chiaini A. Eu. J. Med. Chem. 22 (1987) 473
10. Curtis R.F., and Phillips G.T. Tetrahedron 4419 (1967) 23
11. Afzali A., Breen T.L., and Kagan C.R. Chem. Mater. 14 (2002) 1742
12. Miura A., Chen Z., Uji-i H., De Feyter S., Zdanowska M., Jonkheijm P., Schenning A.P.H.J., Meijer E.W., Würthner F., and De Schryver F.C. Chem. Soc. 125 (2003) 14968
13. Locklin J., Ling M.M., Sung A., Roberts M.E., and Bao Z. Adv. Mater. 18 (2006) 2989
14. Yoon M.-H., DiBenedetto S.A., Russell M.T., Faccetti A., and Marks T.J. Chem. Mater. 19 (2007) 4864
15. Lewis I.C., and Kovac C.A. Mol. Cryst. Liq. Cryst. 51 (1979) 175
16. Vorlaender D. Zeit. Phys. Chem. 126 (1927) 144
17. Ponomarenko S.A., Kirchmeyer S., Halik M., Klauk H., Zschieschang U., Schmid G., Karbach A., Drechsler D., and Alpotova N.M. Synth. Metals 149 (2005) 231
18. Ponomarenko A., Kirchmeyer S., Elschner A., Alpotova N.M., Halik M., Klauk H., Zschieschang U., and Schmid G. Chem. Mater. 18 (2006) 579
19. Didier S., Sergyev S., and Geerts Y.H. Tetrahedron 63 (2007) 941
20. Fichou D., Bachet B., Demanze F., Billy I., Horowitz G., and Garnier F. Adv. Mater. 8 (1996) 500
21. M. Ito, W.Y. Li, N. Yoshimoto, H. Muraoka, S. Ogawa, H. Fujishiro, Y. Asabe, J. Ackermann, C. Videlot-Ackermann, H. Brisset, F. Fages, in press.
22. In: Fichou D. (Ed). Handbook of Oligo- and Polythiophenes (1999), Wiley-VCH, Weinheim
23. Videlot-Ackermann C., Zhang J., Ackermann J., Brisset H., Didane Y., Raynal P., El Kassmi A., and Fages F. Curr. Appl. Phys. (2008) 10.1016/j.cap.2007.10.087
24. Knipp D., Kumar P., Volkel A.R., and Street R.A. Synth. Met. 155 (2005) 485
25. Klauk H., Zschieschang U., Weitz R.T., Meng H., Sun F., Nunes G., Keys D.E., Fincher C.R., and Xiang Z. Adv. Mater. 19 (2007) 3882
26. Cicoira F., Santato C., Dadvand A., Harnagea C., Pignolet A., Bellutti P., Xiang Z., Rosei F., Meng H., and Perepichka D.F. J. Mater. Chem. 18 (2008) 158