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Volumn 47, Issue 10, 2008, Pages 1457-1464
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Simultaneous measurement of refractive index and thickness of birefringent wave plates
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Author keywords
[No Author keywords available]
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Indexed keywords
BIREFRINGENCE;
INTERFEROMETERS;
LASER INTERFEROMETRY;
LIGHT POLARIZATION;
NONDESTRUCTIVE EXAMINATION;
OPTICAL DEVICES;
OPTICAL WAVEGUIDES;
UNITS OF MEASUREMENT;
HIGHLY ACCURATE;
LASER INTERFEROMETER;
METROLOGY SYSTEMS;
NON-DESTRUCTIVE MEASUREMENT;
OPTICAL WAVE PLATES;
POSITION SENSING DETECTORS;
SIMULTANEOUS MEASUREMENT;
THICKNESS PROPERTIES;
REFRACTIVE INDEX;
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EID: 48949101234
PISSN: 1559128X
EISSN: 15394522
Source Type: Journal
DOI: 10.1364/AO.47.001457 Document Type: Article |
Times cited : (10)
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References (8)
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