A measurement system for determining the thickness of an optical wave plate

Optics Communications

Volumn 253, Issue 1-3, 2005, Pages 2-9

  Jang, Ming Jyi ^a   Lu, Chih Feng ^b  

^a FAR EAST UNIVERSITY   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Laser interferometer; Optical path difference; Thickness measurement

Indexed keywords

ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; INTERFEROMETERS; LASER APPLICATIONS; MEASUREMENT THEORY; SCANNING ELECTRON MICROSCOPY; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; WAVELET TRANSFORMS;

HIGH-PRECISION MEASUREMENT; LASER INTERFEROMETER; OPTICAL PATH DIFFERENCE; OPTICAL WAVE PLATES;

OPTICAL SYSTEMS;

EID: 23844525529     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.04.038     Document Type: Article

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10. e = 1.5518 (633 nm)] 1995