Metameric interference security image structures

Applied Optics

Volumn 47, Issue 10, 2008, Pages 1585-1593

  Baloukas, Bill ^a   Martinu, Ludvik ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AUTHENTICATION; IMAGE ANALYSIS; ION BEAMS; LIGHT SOURCES; SPUTTERING;

DESIGN APPROACHES; DIFFERENT STRUCTURE; DUAL ION BEAM SPUTTERING; HIDDEN IMAGES; IMAGE STRUCTURES; INTERFERENCE FILTERS; OBSERVATION ANGLE; PROTOTYPE DEVICES;

LASER MATERIALS PROCESSING;

EID: 48949087809     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.001585     Document Type: Article

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