Ion spectroscopy - A diamond characterization tool

Diamond and Related Materials

Volumn 17, Issue 7-10, 2008, Pages 1159-1163

  Berdermann, E ^a   Caragheorgheopol, A ^b   Ciobanu, M ^a   Pomorski, M ^a   Pullia, A ^c   Riboldi, S ^c   Traeger, M ^a   Weick, H ^a  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^b National Institute for Physics and Nuclear Engineering   (Romania)

^c UNIVERSITY OF MILAN   (Italy)

Author keywords

CVD diamond; Diamond characterization; Energy loss spectroscopy; Heavy ion detectors

Indexed keywords

CARRIER TRANSPORT; CHARACTERIZATION; DEFECT DENSITY; ELECTRIC FAULT CURRENTS; ENERGY DISSIPATION; HEAVY IONS; SINGLE CRYSTALS; SYNTHETIC DIAMONDS;

CHARACTERIZATION METHODS; CVD DIAMOND; DIAMOND CHARACTERIZATION; ENERGY-LOSS SPECTROSCOPY; GLOBAL QUALITY PARAMETERS; HEAVY-ION DETECTORS; SINGLE CRYSTAL CVD DIAMOND; SPACE-CHARGE-LIMITED CURRENT;

POWER QUALITY;

EID: 48849115357     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2008.03.036     Document Type: Article

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