New punch-through assisted hot holes programming mechanism for reliable SONOS flash memories with thick tunnel oxide

2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop, Proceedings, NVSMW

Volumn , Issue , 2007, Pages 92-93

  Akil, N ^a   Van Duuren, M ^a   Goluboviae D S ^a   Boutchich, M ^a   Van Schaijk, R ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 48649089357     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NVSMW.2007.4290595     Document Type: Conference Paper

References (4)

1. B. Eitan et al. IEDM 2005, pp.547-550.
2. J-Y. Wu et al. EDL, Vol. 27, No.2, pp. 127-129, 2006.
3. M. Slotboom et al., ICMTD, pp. 231-233, 2005.
4. N. Akil et al., to be published in ICMTD 2007.