Investigation of reliability characteristics of Si nanocrystal NOR memory arrays

2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop, Proceedings, NVSMW

Volumn , Issue , 2007, Pages 71-72

  Jacob, S ^a,b   Perniola, L ^b   Festes, G ^a   Bodnar, S ^a   Coppard, R ^a   Thiery, J F ^a   Pedron, T ^a   Jalaguier, E ^b   Boulanger, F ^b   De Salvo, B ^b   Deleonibus, S ^b  

^a ATMEL Rousset   (France)

^b CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 48649083671     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NVSMW.2007.4290585     Document Type: Conference Paper

References (7)

1. B.DeSalvo et al., Tech. Dig. of IEDM, p.597, 2003.
2. R.Muralidhar et al., Tech. Dig. of IEDM, p.601, 2003.
3. B.DeSalvo et al., IEEE Trans. Dev. Mat. Reliab.,p.377, 2004.
4. G.Ammendola et al., Sol. St. El., p.1483, 2004.
5. S.Lombardo et al., IEEE NVSMW, p.69, 2004.
6. C.T. Swift et al., IEEE NVSMW, p.56, 2006.
7. B.DeSalvo et al., IEEE Trans. El. Dev., p.1789, 2001.