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Volumn 78, Issue 3, 2008, Pages

Multiple scattering approach for two-electron resonant emission studied by angle-resolved coincidence spectroscopy

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EID: 48449097433     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.035122     Document Type: Article
Times cited : (11)

References (27)
  • 2
    • 0344334946 scopus 로고
    • JPAPEH 0953-4075 10.1088/0953-4075/25/16/001
    • N. M. Kabachnik, J. Phys. B JPAPEH 0953-4075 10.1088/0953-4075/25/16/001 25, L389 (1992).
    • (1992) J. Phys. B , vol.25 , pp. 389
    • Kabachnik, N.M.1
  • 7
    • 48449099369 scopus 로고    scopus 로고
    • The effective inelastic mean-free path is given by λc λp λa / (λp + λa) < λp, λa, where λp and λa are the inelastic mean-free path for the photoelectron and the Auger electron, respectively.
    • The effective inelastic mean-free path is given by λc λp λa / (λp + λa) < λp, λa, where λp and λa are the inelastic mean-free path for the photoelectron and the Auger electron, respectively.
  • 15
    • 0002010637 scopus 로고
    • CPHCBZ 0010-4655 10.1016/0010-4655(95)00139-5
    • J. P. Desclaux, Comput. Phys. Commun. CPHCBZ 0010-4655 10.1016/0010-4655(95)00139-5 9, 31 (1975).
    • (1975) Comput. Phys. Commun. , vol.9 , pp. 31
    • Desclaux, J.P.1
  • 17
    • 0343092625 scopus 로고
    • edited by Bernd Crasemann (Plenum, New York
    • W. R. Johnson and K. T. Cheng, in Atomic Inner Shell Physics, edited by, Bernd Crasemann, (Plenum, New York, 1985), Chap., pp. 1-29.
    • (1985) Atomic Inner Shell Physics , pp. 1-29
    • Johnson, W.R.1    Cheng, K.T.2
  • 19
    • 33749406682 scopus 로고
    • AQCHA9 0065-3276 10.1016/S0065-3276(08)60561-4
    • K. H. Johnson, Adv. Quantum Chem. AQCHA9 0065-3276 10.1016/S0065-3276(08) 60561-4 7, 143 (1973).
    • (1973) Adv. Quantum Chem. , vol.7 , pp. 143
    • Johnson, K.H.1
  • 22
    • 48449096345 scopus 로고    scopus 로고
    • MS-SPEC code by D. Sébilleau (multiple-scattering code for photoelectron, Auger-electron diffraction, APECS, EXAFS, and LEED). Available upon request
    • MS-SPEC code by D. Sébilleau (multiple-scattering code for photoelectron, Auger-electron diffraction, APECS, EXAFS, and LEED). Available upon request (didier.sebilleau@univ-rennes1.fr).
  • 23
    • 0001074638 scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.41.8139
    • J. J. Rehr and R. C. Albers, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.41.8139 41, 8139 (1990).
    • (1990) Phys. Rev. B , vol.41 , pp. 8139
    • Rehr, J.J.1    Albers, R.C.2
  • 24
    • 0000740354 scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.55.1303
    • R. M. Tromp, R. J. Hamers, and J. E. Demuth, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.55.1303 55, 1303 (1985).
    • (1985) Phys. Rev. Lett. , vol.55 , pp. 1303
    • Tromp, R.M.1    Hamers, R.J.2    Demuth, J.E.3
  • 25
    • 0004188486 scopus 로고
    • edited by L. Ley and M. Cardona (Springer, Berlin
    • Photoemission in Solids, edited by, L. Ley, and, M. Cardona, (Springer, Berlin, 1979), Vol. II.
    • (1979) Photoemission in Solids , vol.2
  • 26
  • 27
    • 0029491221 scopus 로고
    • SUSCAS 0039-6028 10.1016/0039-6028(95)00815-2
    • D. Agliz, A. Quémerais, and D. Sébilleau, Surf. Sci. SUSCAS 0039-6028 10.1016/0039-6028(95)00815-2 343, 80 (1995).
    • (1995) Surf. Sci. , vol.343 , pp. 80
    • Agliz, D.1    Quémerais, A.2    Sébilleau, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.