Hydrogen-bonding layer protecting polyelectrolyte capsules and its mechanical property study with Atomic Force Microscope

Journal of Nanoscience and Nanotechnology

Volumn 8, Issue 6, 2008, Pages 2996-3002

  Ge, Liqin ^a   Wang, Xing ^a   Ba, Long ^a   Gu, Zhongze ^a  

^a SOUTHEAST UNIVERSITY   (China)

Author keywords

Atomic force microscopy; Hydrogen bonding multilayered capsules; Layer by layer; Mechanical property

Indexed keywords

ATOMIC FORCE MICROSCOPE; CONFOCAL LASER SCANNING MICROSCOPE; ELASTIC PROPERTIES; FORCE CURVES; GLASS BEADS; HYDROGEN BONDINGS; HYDROGEN-BONDING MULTILAYERED CAPSULES; LAYER-BY-LAYER; LAYER-BY-LAYER SELF-ASSEMBLY METHOD; MECHANICAL PROPERTY; MICROCAPSULE; MULTI-LAYERED; POLYELECTROLYTE CAPSULES; POLYMER CAPSULES; PROPERTY STUDY; SCANNING ELECTRON MICROSCOPE; YOUNG'S MODULUS;

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; DEFORMATION; ELASTIC DEFORMATION; ELASTICITY; ELECTRON BEAM LITHOGRAPHY; ENERGY ABSORPTION; ERROR ANALYSIS; EXTREME ULTRAVIOLET LITHOGRAPHY; HYDROGEN; IMAGING TECHNIQUES; MECHANICAL PROPERTIES; NONMETALS; OPTICAL DESIGN; POLYELECTROLYTES; POLYMERS; SCANNING; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY;

MICROSCOPES;

ELECTROLYTE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; HYDROGEN BOND; METHODOLOGY; SCANNING ELECTRON MICROSCOPY;

ELECTROLYTES; HYDROGEN BONDING; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING;

EID: 48449094303     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2008.156     Document Type: Article

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