Experimental investigation of radiation damage on CCD with protons and Cobalt 60 gamma rays

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 2005, Pages

  Qingkui, Yu ^a   Min, Tang ^a   Hengjing, Zhu ^a   Haiming, Zhang ^a   Yanwei, Zhang ^a   Jixing, Sun ^a  

^a CHINA ACADEMY OF SPACE TECHNOLOGY   (China)

Author keywords

CCD; Displacement damage; Total dose radiation

Indexed keywords

ATOMS; CHARGE COUPLED DEVICES; COBALT; DEGRADATION; DIGITAL CAMERAS; ELECTRIC LOAD MANAGEMENT; ELECTRIC POWER PLANTS; GAMMA RAYS; IONIZING RADIATION; PROTONS; SULFATE MINERALS; TRANSITION METALS;

COBALT-60; DAMAGE DOSE; DISPLACEMENT DAMAGES; EUROPEAN; EXPERIMENTAL INVESTIGATIONS; ON ORBITS; SPACE ENVIRONMENTS; TDI-CCD; TOTAL IONIZING DOSE (TID);

RADIATION EFFECTS;

EID: 48349134274     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RADECS.2005.4365667     Document Type: Conference Paper

References (4)

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3. M. R. Shaneyfelt, J. R. Schwank, D. M. Fleetwood, P. S. Winokur, K. L. Hughes, and F. W. Sexton, "Field Dependence of Interface-Trap Buidup in Polysilicon and Metal Gate MOS Devices," IEEE Trans. Nucl. Sci. vol.37, pp.1632-1640,Dec.1990.
4. Christian Poivey,"Radiation Effects-From Particles to Payloads,Section V:Radiation Hardness Assurance for Space Systems," 2002 IEEE NSREC short course,Phoenix, July,2002