Sub-electron noise measurements on repetitive non-destructive readout devices

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 566, Issue 2, 2006, Pages 536-539

  Wölfel, Stefan ^a,d   Herrmann, Sven ^a,d   Lechner, Peter ^c,d   Lutz, Gerhard ^b,d   Porro, Matteo ^a,d   Richter, Rainer ^b,d   Strüder, Lothar ^a,d   Treis, Johannes ^a,d  

^a MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^b MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

^c PNSENSOR GMBH   (Germany)

^d MPI HALBLEITERLABOR   (Germany)

Author keywords

Active pixel sensor; DEPFET; RNDR; Spectroscopy; Sub electron noise

Indexed keywords

CHARGE TRANSFER; COMPUTER SIMULATION; DETECTORS; FIELD EFFECT TRANSISTORS; GATES (TRANSISTOR); MONTE CARLO METHODS; NONDESTRUCTIVE EXAMINATION; READOUT SYSTEMS; SPECTROSCOPIC ANALYSIS;

ACTIVE PIXEL SENSORS; SUB-ELECTRON NOISE;

ACOUSTIC VARIABLES MEASUREMENT;

EID: 33748765228     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.06.060     Document Type: Article

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