Analysis of the measurement precision of an amorphous silicon EPID used for MLC leaf position quality control and the long-term calibration stability of an optically controlled MLC

Physics in Medicine and Biology

Volumn 53, Issue 15, 2008, Pages

  Budgell, G J ^a   Clarke, M F ^a  

^a CHRISTIE HOSPITAL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CALIBRATION; CUSTOMER SATISFACTION; DIFFUSERS (OPTICAL); INDUSTRIAL ENGINEERING; MEASUREMENTS; NONMETALS; OPTICAL INSTRUMENTS; OPTICAL SYSTEMS; POSITION MEASUREMENT; PROBLEM SOLVING; QUALITY ASSURANCE; QUALITY FUNCTION DEPLOYMENT; QUANTUM CHEMISTRY; QUANTUM THEORY; SILICON; STANDARDS; SYSTEM STABILITY; TOTAL QUALITY MANAGEMENT;

DATA SETS; ELECTRONIC PORTAL IMAGING DEVICES; LEAF POSITION; LONG TIME; LONG-TERM STABILITY; MEASUREMENT PRECISION; MULTI-LEAF COLLIMATOR; OPTICAL-; OPTICALLY CONTROLLED; RELATIVE MEASUREMENTS; REPRODUCIBILITY; STANDARD DEVIATIONS;

QUALITY CONTROL;

ARTICLE; CALIBRATION; COLLIMATOR; DIAGNOSTIC ACCURACY; ELECTRONIC PORTAL IMAGING DEVICE; MEASUREMENT; MEDICAL INSTRUMENTATION; PRIORITY JOURNAL; QUALITY CONTROL;

CALIBRATION; OPTICS; QUALITY CONTROL; RADIOTHERAPY; SENSITIVITY AND SPECIFICITY; SILICON; TIME FACTORS;

EID: 48349098336     PISSN: 00319155     EISSN: 13616560     Source Type: Journal    
DOI: 10.1088/0031-9155/53/15/N01     Document Type: Article

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