Optimal Lp-metric for minimizing powered deviations in regression

Journal of Modern Applied Statistical Methods

Volumn 6, Issue 1, 2007, Pages 219-227

  Lipovetsky, Stan ^a  

^a GfK Custom Research North America   (United States)

Author keywords

Absolute and squared deviations; Gamma function; Lp metric; Regression

Indexed keywords

EID: 48249092283     PISSN: 15389472     EISSN: 15389472     Source Type: Journal    
DOI: 10.22237/jmasm/1177993140     Document Type: Article

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