A practical guide to the measurement of structure phases and magnitudes by three-beam convergent beam electron diffraction

Ultramicroscopy

Volumn 108, Issue 9, 2008, Pages 901-910

  Nakashima, Philip N H ^a   Moodie, Alexander F ^a   Etheridge, Joanne ^a  

^a MONASH UNIVERSITY   (Australia)

Author keywords

Convergent beam electron diffraction; Direct structure determination; Inversion; Phase problem; Structure phases and magnitudes; Three phase invariant

Indexed keywords

ALUMINUM; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; HOLOGRAPHIC INTERFEROMETRY;

CENTROSYMMETRIC CRYSTALS; CONVERGENT BEAM ELECTRON DIFFRACTION (CBED); DIRECT MEASUREMENTS; PRACTICAL GUIDE; STEP-BY-STEP; STRUCTURAL PHASES; STRUCTURE PHASES; WORKED EXAMPLES;

DIFFRACTION;

ACCURACY; ARTICLE; ELECTRON DIFFRACTION; GEOMETRY; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; MEASUREMENT;

EID: 48149112301     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.03.002     Document Type: Article

References (14)

1. Moodie A.F. Some problems in imaging and inversion. Chem. Scripta 14 (1978-79) 21
2. Moodie A.F., Etheridge J., and Humphreys C.J. The symmetry of three-beam scattering equations: inversion of three-beam diffraction patterns from centrosymmetric crystals. Acta Cryst. A 52 (1996) 596-605
3. A.F. Moodie, J. Etheridge, C.J. Humphreys. The Electron, IOM Communications Ltd, London, UK, 1998, Ch. The Coulomb Interaction and Direct Measurement of Structural Phase, pp. 235.
4. Nakashima P.N.H., Moodie A.F., and Etheridge J. Structural phase and amplitude measurement from distances in convergent beam electron diffraction patterns. Acta Cryst. A 63 (2007) 387
5. Sturkey L. The calculation of electron diffraction intensities. Proc. Phys. Soc. 80 (1962) 321
6. Hauptman H.A. Crystal Structure Determination-The Role of the Cosine Seminvariants (1972), Plenum Press, London
7. Blackman M. On the intensities of electron diffraction rings. Proc. Roy. Soc. A 173 952 (1939) 68
8. Bethe H. Theorie der beugung von elektronen an kristallen. Ann. Phys. 392 (1928) 55
9. Gjønnes J. The dynamic potentials in electron diffraction. Acta Cryst. 15 (1962) 703
10. Digital Micrograph Software by Gatan Inc. URL: 〈http://www.gatan.com/imaging/dig_micrograph.html〉.
11. Goodman P. The Borrmann effect in few-beam electron diffraction patterns: use of the Born series to analyse diffraction assymetries. Z. Naturforsch. 28A (1973) 580
12. Nakashima P.N.H. Thickness difference-a new quantitative filtering tool for electron diffraction. Phys. Rev. Lett. 99 12 (2007) 125506
13. Streltsov V.A., Nakashima P.N.H., and Johnson A.W.S. A combination method of charge density measurement in hard materials using accurate. quantitative electron and X-ray diffraction, Microsc. Microanal. 9 5 (2003) 419
14. 3. Acta Cryst. B 49 (1993) 973