Estimating the complex index of refraction and view angle of an object using multiple polarization measurements

Conference Record - Asilomar Conference on Signals, Systems and Computers

Volumn , Issue , 2006, Pages 1067-1071

  Thilak, Vimal ^a   Creusere, Charles D ^a   Voelz, David G ^a  

^a Horeshoe Cir Jett Hall   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BI-DIRECTIONAL REFLECTANCE; COMPLEX INDEX OF REFRACTION; DEGREE OF POLARIZATION (DOP); DIELECTRIC TARGETS; FEATURE VECTOR (FV); LABORATORY CONDITIONS; MATERIAL CLASSIFICATION; MULTIPLE MEASUREMENTS; NON-LINEAR LEAST SQUARES; OBJECT SEGMENTATION; PASSIVE POLARIZATION; POLARIZATION MEASUREMENTS; POLARIZATION STATE (PS); REAL-WORLD DATA; REMOTE SENSING APPLICATIONS; SYSTEM RECORDS; TARGET DETECTIONS;

CURVE FITTING; ESTIMATION; IMAGING SYSTEMS; IMAGING TECHNIQUES; LEAST SQUARES APPROXIMATIONS; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; POLARIMETERS; POLARIZATION; REFRACTION; REFRACTIVE INDEX; REMOTE SENSING; SPACE OPTICS; TARGETS;

STEREOCHEMISTRY;

EID: 37549022512     PISSN: 10586393     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ACSSC.2006.354916     Document Type: Conference Paper

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