Birefringence in spin-coated films containing cellulose nanocrystals

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 325, Issue 1-2, 2008, Pages 44-51

  Cranston, Emily D ^a   Gray, Derek G ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

AFM; Birefringence; Nanocrystalline cellulose; Optical reflectometry; Spin coating

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; BIREFRINGENCE; CELLULOSE; CELLULOSE FILMS; CLADDING (COATING); COMPOSITE FILMS; CRYSTALLOGRAPHY; FILM PREPARATION; FILM THICKNESS; LITHOGRAPHY; MICROSCOPIC EXAMINATION; MOLECULAR BEAM EPITAXY; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; ORGANIC POLYMERS; POLYMERS; REFLECTION; REFLECTOMETERS; REFRACTIVE INDEX; SCANNING PROBE MICROSCOPY; SPIN COATING; SPIN DYNAMICS; THICK FILMS;

ANGLE DEPENDENT; ANISOTROPIC THIN FILMS; ATOMIC FORCE (AF); BI-LAYERS; CELLULOSE NANOCRYSTALS; FILM EDGE; IN ORDER; INTRINSIC SHAPE; LAYER BY LAYER (LBL); NOVE L APPROACH; OPTICAL (PET) (OPET); OPTICAL REFLECTOMETRY; POLYALLYLAMINE HYDROCHLORIDE (PAH); POLYELECTROLYTE MULTILAYER (PEM) FILMS; SELF-ASSEMBLED; SILICON (111) SUBSTRATES; SPIN COATINGS; SPIN-AXIS; SPIN-COATED FILMS;

MULTILAYER FILMS;

ALLYLAMINE DERIVATIVE; CELLULOSE; NANOCRYSTAL; NANOFILM; POLY(ALLYLAMINE); POLYELECTROLYTE; SILICON;

ANISOTROPY; ARTICLE; ATOMIC FORCE MICROSCOPY; BILAYER MEMBRANE; BIREFRINGENCE; ELLIPSOMETRY; FILM; PRIORITY JOURNAL; REFLECTOMETRY;

ALLOY; ANISOTROPY; BIREFRINGENCE; CELLULOSE; COATINGS; CRYSTALLOGRAPHY; ELECTRON MICROSCOPY; FILM; LITHOGRAPHY; MULTILAYERS; OPTICAL PROPERTIES; POLYELECTROLYTES; POLYMERS; REFRACTIVITY; SILICON COMPOUNDS; SUBSTRATES;

EID: 47949119528     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2008.04.042     Document Type: Article

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