Using quality metrics with laser range scanners

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6805, Issue , 2008, Pages

  MacKinnon, David ^a,b   Aitken, Victor ^a   Biais, Francois ^b  

^a CARLETON UNIVERSITY   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Adaptive scanning; Automated scanning; Operator guided scanning; Quality metrics; Range imaging

Indexed keywords

AUTOMATION; IMAGING SYSTEMS; LASERS; MERGERS AND ACQUISITIONS; RADAR; THREE DIMENSIONAL; UNCERTAINTY ANALYSIS;

ADAPTIVE SCANNING; AUTOMATED SCANNING; OPERATOR-GUIDED SCANNING; QUALITY METRICS; RANGE IMAGING;

SCANNING;

EID: 47949101598     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.766522     Document Type: Conference Paper

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