Semi-parametric cluster detection

Journal of Statistical Theory and Practice

Volumn 1, Issue 1, 2007, Pages 49-72

  Kedem, Benjamin ^a   Wen, Shihua ^a  

^a Bldg 142   (United States)

Author keywords

Combined data; Exponential tilt; Likelihood; Moving window; Power; Scan statistics

Indexed keywords

EID: 47949095717     PISSN: 15598608     EISSN: 15598616     Source Type: Journal    
DOI: 10.1080/15598608.2007.10411824     Document Type: Article

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