Entanglement-seeded, dual, optical parametric amplification: Applications to quantum imaging and metrology

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 78, Issue 1, 2008, Pages

  Glasser, Ryan T ^a   Cable, Hugo ^a   Dowling, Jonathan P ^a   De Martini, Francesco ^b   Sciarrino, Fabio ^b   Vitelli, Chiara ^b  

^a LOUISIANA STATE UNIVERSITY   (United States)

^b SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT; LIGHT AMPLIFIERS; LITHOGRAPHY; MICROWAVE AMPLIFIERS; OPTICAL FREQUENCY CONVERSION; PARAMETRIC AMPLIFIERS; PARAMETRIC DEVICES; QUANTUM OPTICS; RISK ASSESSMENT;

AMERICAN PHYSICAL SOCIETY (APS); ENTANGLED STATES; FRINGE PATTERNS; HEISENBERG; MEASUREMENT SENSITIVITIES; NON CLASSICAL LIGHT; OPTICAL PARAMETRIC AMPLIFICATION (OPA); OPTICAL PARAMETRIC AMPLIFIERS (OPAS); OUTPUT STATE; QUANTUM IMAGING; QUANTUM INTERFEROMETRY; QUANTUM LITHOGRAPHY; QUANTUM METROLOGY; RAYLEIGH; STIMULATED AMPLIFICATION; TWO MODE SQUEEZED VACUUM (TMSV);

AMPLIFICATION;

EID: 47749148850     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.78.012339     Document Type: Article

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