Measurement of a point source radiator using magnetic and electric probes and application to silicon design of clock devices

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 2007, Pages

  Slattery, Kevin ^a   Daniel, Kevin ^a   Xiaopeng, Dong ^a  

^a INTEL CORPORATION   (United States)

Author keywords

EMI; Near field scanning; Probe; Radiaiton; RFI

Indexed keywords

ELECTRIC COMPONENTS; ELECTRIC DIPOLES; ELECTRIC PROBES; EMI; MAGNETIC COMPONENTS; MAGNETIC DIPOLES; MAGNETIC LOOPS; METHOD OF MEASUREMENTS; NEAR-FIELD SCANNING; PC SYSTEMS; POINT SOURCES; RADIAITON; RADIATED FIELDS; RADIATION CHARACTERISTICS; RFI; SCANNING SYSTEMS; SILICON DESIGNS; SMALL APERTURES; SPECIFIC COMPONENTS; TEST POINTS;

ELECTRIC FIELDS; ELECTRIC INVERTERS; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC PULSE; PLASTIC MOLDS; RADIATORS; RADIO INTERFERENCE; SCANNING;

MAGNETIC MATERIALS;

EID: 47749138233     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.2007.66     Document Type: Conference Paper

References (6)

1. Near Field Measurements of VLSI Devices, K.P. Slattery, Jeffrey W Neal, Wei Cui, IEEE Transactions on EMC, Vol 41, No. 4, 1999
2. Basic Sources of Electric and Magnetic Fields Newly Examined, W.S. Bennett, IEEE Antennas and Propagation Magazine, Vol 43, No 1, February 2001
3. A Basic Source of Electromagnetic Fields Clarified with Basic Mathematics, W.S. Bennett, IEEE EMC Symposium, 2003
4. st ASEE/IEEE Frontiers in Education Conference, October 2001, Reno, NV
5. Introduction to Electromagnetic Fields, Clayton Paul, 1987, McGraw Hill
6. Calibration and Compensation of near field scan measurements, Jin Shi, M Cracraft, K Slattery, M Yamaguchi, R Dubroff, IEEE Transactions on EMC, Vol 47, No. 3, August 2005