Aura removal algorithm for high-temperature image quantitative analysis systems

Proceedings of the 14th International Conference "Mixed Design of Integrated Circuits and Systems", MIXDES 2007

Volumn , Issue , 2007, Pages 617-621

  Fabijańska, Anna ^a   Sankowski, Dominik ^a  

^a LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Aura phenomenon; Digital image processing; High temperature measurements; Image quantitative analysis; Image segmentation

Indexed keywords

DIGITAL IMAGE STORAGE; ELECTRONICS INDUSTRY; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGE SEGMENTATION; SURFACE PROPERTIES;

AURA PHENOMENON; DIGITAL IMAGE PROCESSING; HIGH TEMPERATURE; HIGH TEMPERATURE MEASUREMENTS; HIGH TEMPERATURES; IMAGE QUANTITATIVE ANALYSIS; INTERNATIONAL CONFERENCES; MEASUREMENT PROCESSES; OBJECT SHAPE; QUANTITATIVE ANALYSIS; SEGMENTATION PROCESSING; SEGMENTATION QUALITY;

INTEGRATED CIRCUITS;

EID: 47749092177     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIXDES.2007.4286236     Document Type: Conference Paper

References (12)

1. R. Gonzalez, R. Woods: "Digital Image Processing (2nd Edition)", Prentice Hall, 2002.
2. I. Young, J. Gerbrands, L. van Vliet: "Fundamentals of Image Processing", The Netherlands, Delft University of Technology, 1998.
3. W. Pratt: "Digital image processing", John Wiley & Sons, Los Atlos, California, 2001.
4. K. Fu, J. Mui: "A survey on image segmentation", Pattern Recognition Letters, Vol. 13, pp. 3-16, 1981.
5. R. Haralick, L. Shapiro: "Survey: Image segmentation techniques", Computer Vision, Graphics, and Image Processing, Vol. 29, pp. 100-132, 1985.
6. th IEEE Instrumentation and Measurement Technology Conference IMTC, Venice, Italy, pp. 164-168, 1999.
7. D. Sankowski, J. Senkara, K. Strzecha, S. Jeżewski: "Automatic investigation of surface phenomena in high temperature solid and liquid contacts", IEEE Instrumentation and Measurement Technology Conference IMTC, Budapest, Hungary, pp. 1397-1400, 2001.
8. D. Sankowski, J. Senkara, K. Strzecha, "Computerized system for assessment of quality of solders", IEEE The Experience of Designing and Application of CAD Systems in Microelectronics, Proceedings of the VIIth International Conference CADSM, Lviv- Slavske, Ukraine, pp. 56-58, 2003.
9. K. Strzecha, A. Fabijańska: "Segmentation algorithms for industrial image quantitative analysis systems", XVIII IMEKO World Congress Metrology for a Sustainable Development, Rio de Janeiro, Brazil, paper no. 164, 2006.
10. D. Marr, E. Hildreth: "Theory of edge detection", Proceedings of Royal Society, Vol. B-207, pp. 187-217, 1980.
11. F. Bergholm: "Edge focusing", IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 9, No. 6, pp. 726-741, 1987.
12. P. Henstock, D. Chelberg: "Automatic gradient threshold determination for edge detection". IEEE Transactions on Image Processing, Vol. 5, No. 5, pp. 784-787, 1996. 622-627