High current density Scandia doped pressed cathode and shaped beam generation

8th IEEE International Vacuum Electronics Conference, IVEC 2007

Volumn , Issue , 2007, Pages 243-244

  Wang, Jinshu ^a   Wang, Yiman ^a   Liu, Wei ^a   Li, Lili ^a   Lu, Hong ^a   Wang, Yanchun ^a   Li, Hongyi ^a   Yang, Jjiancan ^a  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

Nanometer; Scandate cathode; Sheet beam; THz source

Indexed keywords

CURRENT DENSITY; ELECTRON BEAMS; ELECTRON OPTICS; PARTICLE BEAMS; VACUUM;

ELECTRON-BEAM; HIGH CURRENT DENSITIES; NANOMETER; SCANDATE CATHODE; SHAPED BEAMS; SHEET BEAM; THZ SOURCE; VACUUM ELECTRONICS;

VACUUM TECHNOLOGY;

EID: 47649121394     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IVELEC.2007.4283306     Document Type: Conference Paper

References (5)

1. J. Wang, Y. Wang, W. Liu, K. Zhang and J. Li in Proceedings of IVEC/IVESC 2006 pp. 53
2. R.L. Ives IEEE Trans. on Plasma Sciences, Vol.32, pp 1277
3. China Patent. CN 06 1 88813.3
4. W. Liu, K. Zhang, Y. Wang et al Appl. Surf. Sci. Vol 251, 2005, pp 106
5. J.Yang, Y. Wang, Y. Lu, K. Zhao et al in Proceeding of IVEC/IVESC 2006 pp. 343