Circuit design with metallic single-electron tunneling junctions

European Solid-State Circuits Conference

Volumn , Issue , 2002, Pages 671-674

  Hoekstra, J ^a   Klunder, R H ^a   Van De Haar, R ^a   Rouw, E ^a   Chand, P ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT DESIGNS; COULOMB BLOCKADE PHENOMENA; DESIGN STRATEGIES; EQUIVALENT CIRCUIT MODEL; LOCAL POTENTIALS; SINGLE ELECTRONICS; SINGLE-ELECTRON TUNNELING JUNCTIONS; TUNNEL RESISTANCE;

CIRCUIT SIMULATION; CIRCUIT THEORY; SINGLE ELECTRON TRANSISTORS; TRANSIENTS;

ELECTRON TUNNELING;

EID: 4744352011     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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