On the electrical characteristics of latent finger mark corrosion of brass

Journal of Physics D: Applied Physics

Volumn 41, Issue 12, 2008, Pages

  Bond, J W ^a,b  

^a Northamptonshire Police   (United Kingdom)

^b UNIVERSITY OF LEICESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BRASS; COPPER; COPPER OXIDES; DEPOSITS; DISTILLATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMICAL CORROSION; GALVANIZING; METALLIC COMPOUNDS; METALS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR MATERIALS;

APPLIED POTENTIALS; COPPER (II); COPPER(I); CORROSION PRODUCT (RUST); CURRENT VOLTAGE (I V) CHARACTERISTICS; ELECTRICAL CHARACTERISTICS; GALVANIC CORROSIONS; METAL OXIDES; METAL-SEMICONDUCTOR CONTACTS; NON-LINEAR; P-TYPE SEMICONDUCTORS; SCHOTTKY; SIMPLE MODELING;

CORROSION;

EID: 47249161955     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/12/125502     Document Type: Article

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