Low-temperature preparation and characterization of TiO2 thin films with a bicrystalline framework

Wuli Huaxue Xuebao/ Acta Physico - Chimica Sinica

Volumn 23, Issue 3, 2007, Pages 414-418

  Yan, Shan Shan ^a   Wu, Lian Di ^a   Chen, Feng ^a   Zhang, Jin Long ^a  

^a EAST CHINA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Average roughness; Bicrystalline framework; Low temperature preparation; Photocatalytic activity; TiO2 thin film

Indexed keywords

EID: 47249155132     PISSN: 10006818     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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