![]() |
Volumn 20, Issue 28, 2008, Pages
|
A new procedure for calculating the density and energy distribution of localized hopping sites in disordered semiconductors, using low-temperature electrical conductivity data
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CARRIER CONCENTRATION;
CARRIER TRANSPORT;
CIVIL AVIATION;
CONCENTRATION (PROCESS);
ELECTRIC CONDUCTIVITY;
ELECTRIC POWER DISTRIBUTION;
ION BEAMS;
QUANTUM CHEMISTRY;
CARRIER (CO);
CONDUCTIVITY DATA;
DENSITY OF STATES (DOF);
DISORDERED SEMICONDUCTORS;
DISORDERED SOLIDS;
ELECTRICAL CONDUCTIVITY;
ENERGY DEPENDENT;
ENERGY DISTRIBUTIONS;
HOPPING SITES;
LOCALIZED STATES;
LOW TEMPERATURE (LTR);
QUANTUM MECHANICAL TUNNELLING;
TRANSPORT ENERGY;
CARRIER MOBILITY;
|
EID: 47249130288
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/20/28/285210 Document Type: Article |
Times cited : (19)
|
References (14)
|