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Volumn , Issue , 2008, Pages 810-813

Al to Al wafer bonding for MEMS encapsulation and 3-D interconnect

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; COMPOSITE MICROMECHANICS; COPPER; ENCAPSULATION; MECHANICAL ENGINEERING; MECHANICS; MECHATRONICS; MEMS; MICROELECTROMECHANICAL DEVICES; REACTIVE ION ETCHING; SILICON; SILICON WAFERS; THREE DIMENSIONAL;

EID: 47249125974     PISSN: 10846999     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MEMSYS.2008.4443780     Document Type: Conference Paper
Times cited : (43)

References (6)
  • 3
    • 10944257636 scopus 로고    scopus 로고
    • Characterization of wafer-level thermocompression bonds
    • C. H. Tsau, S. M. Spearing, and M. A. Schimidt, "Characterization of wafer-level thermocompression bonds," J. Microelectromech. Sys., vol. 13, pp. 963-971, 2004.
    • (2004) J. Microelectromech. Sys , vol.13 , pp. 963-971
    • Tsau, C.H.1    Spearing, S.M.2    Schimidt, M.A.3
  • 5
    • 50149109406 scopus 로고    scopus 로고
    • MIL-STD-883E Method 2019.7, Die shear strength, 2003.
    • MIL-STD-883E Method 2019.7, "Die shear strength," 2003.
  • 6
    • 50149108589 scopus 로고    scopus 로고
    • MIL-STD-750E Method 1071.8, Hermetic seal, 2007.
    • MIL-STD-750E Method 1071.8, "Hermetic seal," 2007.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.