Random telegraph signal statistical analysis using a very large-scale array TEG with 1M MOSFETs

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2007, Pages 210-211

  Abe, K ^a   Sugawa, S ^a   Watabe, S ^a   Miyamoto, N ^a   Teramoto, A ^a   Kamata, Y ^b   Shibusawa, K ^b   Toita, M ^c   Ohmi, T ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b Miyagi Oki Electric Co Ltd   (Japan)

^c Asahi Kasei Microsystems Co Ltd   (Japan)

Author keywords

RTS; TEG and characteristic fluctuation

Indexed keywords

TELEGRAPH;

MOSFETS; RANDOM TELEGRAPH SIGNAL (RTS); STATISTICAL ANALYSIS (IGC: E4/K7); TEST ELEMENT GROUP (TEG); VLSI TECHNOLOGIES;

THERMOELECTRIC EQUIPMENT;

EID: 47249097466     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2007.4339696     Document Type: Conference Paper

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