Laser polarimeter as an invariant monitor

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6682, Issue , 2007, Pages

  Tyo, J Scott ^a   Hoover, Brian G ^b  

^a UNIVERSITY OF ARIZONA   (United States)

^b Advanced Optical Technologies   (United States)

Author keywords

Laser polarimetry; Mueller matrix polarimetry; Remote sensing; Scattering

Indexed keywords

ARBITRARY ORIENTATIONS; ELECTROMAGNETIC (EM); MEASUREMENT TECHNOLOGIES; MONITOR (CO); MONITORING ALGORITHMS; MUELLER MATRICES; NON-IMAGING; NON-LINEAR; PROBE ANGLES; PROBE CHARACTERISTICS; PROCESSING ALGORITHMS; SYSTEMATIC (CO); WAVE SCATTERING;

ADAPTIVE ALGORITHMS; DETECTORS; ELECTROMAGNETISM; ELLIPSOMETRY; GRAPHIC METHODS; GROUND OPERATIONS; LASERS; MILITARY OPERATIONS; POLARIMETERS; POLARIZATION; PULSED LASER DEPOSITION; REMOTE SENSING; SPACE OPTICS;

DATA PROCESSING;

EID: 47149110725     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.735639     Document Type: Conference Paper

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