Active detection of off-diagonal Mueller elements of rough targets

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5158, Issue , 2003, Pages 226-238

  Hoover, Brian G ^a   Dayton, David C ^a   Havey, Jason E ^a   Gonglewski, John D ^b   Gamiz, Victor L ^b   Ulibarri, Laura J ^b  

^a APPLIED TECHNOLOGY ASSOCIATES   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; DIELECTRIC MATERIALS; LIGHT POLARIZATION; LIGHT SCATTERING; MATRIX ALGEBRA; POLARIMETERS; SURFACE ROUGHNESS; TRANSCEIVERS;

MUELLER ELEMENTS; POLARIZERS;

REMOTE SENSING;

EID: 1842479423     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.507350     Document Type: Conference Paper

References (19)

1. S. Breugnot and P. Clemenceau, "Modeling and performances of a polarization active imager at λ = 806nm," Opt. Eng. 39(10), 2681-2688 (2000).
2. P.-Y. Gerligand, M. H. Smith, and R. A. Chipman, "Polarimetric images of a cone," Opt. Exp. 4(10), 420-430 (1999).
3. G. W. Kattawar and M. J. Rakovic, "Virtues of Mueller matrix imaging for underwater target detection," Appl. Opt. 38(30), 6431-6438 (1999).
4. R. A. Chipman, "Polarimetry," in Handbook of Optics, (McGraw-Hill, New York, 1994), Chap. 22.
5. T. A. Germer, "Polarized light scattering by microroughness and small defects in dielectric layers," J. Opt. Soc. Am A 18(6), 1279-1288 (2001).
6. A. Ishimaru and J. S. Chen, "Scattering from very rough metallic and dielectric surfaces: a theory based on the modified Kirchhoff approach," Waves Random Media 1(1), 21-34 (1991).
7. N. C. Bruce, A. J. Sant, and J. C. Dainty, "The Mueller matrix for rough surface scattering using the Kirchhoff approximation," Opt. Commun. 88, 471-484 (1992).
8. T. R. Michel, M. E. Knotts, and K. A. O'Donnell, "Stokes matrix of a one-dimensional perfectly conducting rough surface," J. Opt. Soc. Am. A 9, 585-96 (1992).
9. D. Bicout, C. Brosseau, A. S. Martinez, and J. M. Schmitt, "Depolarization of multiply scattered waves by spherical diffusers: Influence of the size parameter," Phys. Rev. E 49(2), 1767-1770 (1994).
10. G. D. Lewis, D. L. Jordan, and E. Jakeman, "Backscatter linear and circular polarization analysis of roughened aluminum," Appl. Opt. 37(25), 5985-5992 (1998).
11. J. Ellis, P. Caillard, and A. Dogariu, "Off-diagonal Mueller matrix elements in backscattering from highly diffusive media," J. Opt. Soc. Am. A 19, 43-48 (2002).
12. K. A. O'Donnell and M. E. Knotts, "Polarization dependence of scattering from one-dimensional rough surfaces," J. Opt. Soc. Am. A 8(7), 1126-1131 (1991).
13. D. C. Dayton, B. G. Hoover, and J. D. Gonglewski, "Full-order Mueller matrix polarimeter using liquid-crystal phase retarders and active illumination," in Optics in Atmospheric Propagation and Adaptive Systems V, Proc. SPIE 4884 (2002).
14. R. Barakat, "The statistical properties of partially polarized light," Opt. Acta 32, 295-312 (1985).
15. G. D. Lewis and D. L. Jordan, "Remote sensing of polarimetric speckle," J. Phys. D: Appl. Phys. 34, 1399-1407 (2001).
16. E. Akkermans, P. E. Wolf, R. Maynard, and G. Maret, "Theoretical study of the coherent backscattering of light by disordered media," J. Phys. (France) 49(1), 77-98 (1988).
17. Francis Perrin, "Polarization of light scattered by Isotropic opalescent media," J. Chem. Phys. 10, 415-27 (1942).
18. Max Born and Emil Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980), Chap.13.
19. A. J. Sant, J. C. Dainty, and M.-J. Kim, "Comparison of surface scattering between identical, randomly rough metal and dielectric diffusers," Opt. Lett. 14(21), 1183-1185 (1989).