Charge transfer and polarization screening at organic/metal interfaces: Distinguishing between the first layer and thin films

Journal of Physical Chemistry C

Volumn 112, Issue 15, 2008, Pages 5703-5706

  Peisert, H ^a   Petershans, A ^a,b   Chasse T ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; CHARGE TRANSFER; EMISSION SPECTROSCOPY; GOLD; ION EXCHANGE; LIGHT METALS; MAGNESIUM; MASS TRANSFER; MOLECULAR BEAM EPITAXY; POLARIZATION; THICK FILMS;

AMERICAN CHEMICAL SOCIETY (ACS); AUGER ELECTRONS; CORE HOLE SCREENING; ELECTRONIC POLARIZATION; FINAL STATES; MAGNESIUM PHTHALOCYANINE (MGPC); MODEL SYSTEMS; ORGANIC LAYERS; ORGANIC-METAL INTERFACES; PHOTOEMISSION SPECTROSCOPY (PES); SCREENING MECHANISM;

AUGER ELECTRON SPECTROSCOPY;

EID: 47149093186     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp800674z     Document Type: Article

References (31)

1. Pope, M.; Swenberg, C. E. Electronic Processes in Organic Crystals; Clarendon Press, Oxford, U.K., 1982.
2. Karl, N. Synth. Met. 2003, 133-134, 649.
3. Hill, I. G.; Kahn, A.; Soos, Z. G.; Pascal, R. A., Jr. Chem. Phys. Lett. 2000, 327, 181.
4. Tsiper, E. V.; Soos, Z. G.; Gao, W.; Kahn, A. Chem. Phys. Lett. 2002, 360, 47.
5. Tsiper, E. V.; Soos, Z. G. Phys. Rev. B 2003, 68, 085301.
6. Zhu, X.-Y. Surf. Sci. Rep. 2004, 56, 1.
7. Koch, N.; Vollmer, A.; Duhm, S.; Sakamoto, Y.; Suzuki, T. Adv. Mater. 2007, 19, 112.
8. In order to compare energetic sifts, we use "binding energy" for both core levels and Auger transitions, although the energetic position of the latter is usually given in "kinetic energy".
9. Thomas, T. D.; Weightman, P. Phys. Rev. B 1986, 33, 5406.
10. Moretti, G. Surf. Interface Anal. 1990, 16, 159.
11. Chassé, T.; Franke, R.; Urban, C.; Franzheld, R.; Streubel, P.; Meisel, A. J. Electron Spectrosc. Relat. Phenom. 1993, 62, 287.
12. Peisert, H.; Chassé, T.; Streubel, P.; Meisel, A.; Szargan, R. J. Electron Spectrosc. Relat. Phenom. 1994, 68, 321.
13. Brühwiler, P. A.; Maxwell, A. J.; Nilsson, A.; Mårtensson, N.; Gunnarsson, O. Phys. Rev. B 1993, 48, 18296.
14. Kaindl, G.; Chiang, T.-C.; Eastman, D. E.; Himpsel, F. J. Phys. Rev. Lett. 1980, 45, 1808.
15. Chiang, T.-C.; Kaindl, G.; Mandel, G. Phys. Rev. B 1986, 33, 695.
16. Peisert, H.; Schwieger, T.; Auerhammer, J. M.; Knupfer, M.; Golden, M. S.; Fink, J. J. Appl. Phys. 2002, 91, 4872.
17. Bagus, P. S.; Staemmler, V.; Woll, C. Phys. Rev. Lett. 2002, 89, 096104.
18. Crispin, X.; Geskin, V.; Crispin, A.; Cornil, J.; Lazzaroni, R.; Salaneck, W. R.; Brédas, J. L. J. Am. Chem. Soc. 2002, 124, 8131.
19. Peisert, H.; Knupfer, M.; Fink, J. Appl. Phys. Lett. 2002, 81, 2400.
20. Campbell Scott, J. J. Vac. Sci. Technol., A 2003, 21, 521.
21. Paasch, G.; Peisert, H.; Knupfer, M.; Fink, J.; Scheinen, S. J. Appl. Phys. 2003, 93, 6084.
22. Vázquez, H.; Dappe, Y. J.; Ortega, J.; Flores, F. J. Chem. Phys. 2007, 126, 144703.
23. Ishii, H.; Sugiyama, K.; Ito, E.; Seki, E. K. Adv. Mater. 1999, 11, 605.
24. Zahn, D. R. T.; Gavrila, G. N.; Gorgoi, M. Chem. Phys. 2006, 325, 99.
25. Yamane, H.; Yabuuchi, Y.; Fukagawa, H.; Kera, S.; Okudaira, K. K.; Ueno, N. J. Appl. Phys. 2006, 99, 093705.
26. Biswas, I.; Peisert, H.; Nagel, M.; Casu, M. B.; Schuppler, S.; Nagel, P.; Pellegrin, E.; Chassé, T. J. Chem. Phys. 2007, 126, 174704/1.
27. Hosnino, A.; Takenaka, Y.; Miyaji, H. Acta Crystallogr., Sect. B 2003, 59, 393.
28. Hesse, R.; Chassé, T.; Szargan, R. Anal. Bioanal. Chem. 2003, 375, 856.
29. Zhang, L.; Peisert, H.; Biswas, I.; Knupfer, M.; Batchelor, D.; Chasse, T. Surf. Sci. 2005, 596, 98.
30. Gerlach, A.; Schreiber, F.; Sellner, S.; Dosch, H.; Vartanyants, I. A.; Cowie, B. C. C.; Lee, T.-L.; Zegenhagen, J. Phys. Rev. B 2005, 71, 205425.
31. de Jong, M. P.; Friedlein, R.; Sorensen, S. L.; Öhrwall, G.; Osikowicz, W.; Tengsted, C.; Jönsson, S. K. M.; Fahlman, M.; Salaneck, W. R. Phys. Rev. B 2005, 72, 035448.