A grain boundary defect model for ZnO ceramic varistors by deep heat treatment

Science in China, Series A: Mathematics, Physics, Astronomy

Volumn 41, Issue 1, 1998, Pages 71-78

  Chen, Zhixiong ^a   Lin, Guocong ^a   Fu, Gang ^a   Tang, Dahai ^b  

^a GUANGZHOU UNIVERSITY   (China)

^b Analogic Scientific Inc   (China)

Author keywords

Carrent creep; Grain boundary defect model; Heat treatment; Positron annihilation; ZnO ceramic varistor

Indexed keywords

EID: 0344810534     PISSN: 10069283     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf02900775     Document Type: Article

References (9)

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