Feature selection for self-supervised classification with applications to microarray and sequence data

IEEE Journal on Selected Topics in Signal Processing

Volumn 2, Issue 3, 2008, Pages 297-309

  Kung, Sun Yuan ^a   Mak, Man Wai ^b  

^a PRINCETON UNIVERSITY   (United States)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Doubly supervised; Feature selection; Pairwise approach; Self supervised; Subcellular localization; SVM; Symmetric doubly supervised; Vectorization

Indexed keywords

EDUCATION; FORECASTING; SUPPORT VECTOR MACHINES; VECTORS;

CLASS LABELS; EUCLIDEAN DISTANCE (ED); EXPLICIT INFORMATION; FEATURE SELECTION (FS); GENOMIC APPLICATIONS; LEARNING STRATEGIES; METRICS (CO); MICRO ARRAYS; MICROARRAY DATA; PREDICTION PERFORMANCE; PROTEIN SEQUENCE DATA; SELECTION SCHEME; SEQUENCE DATA; SIMULATION STUDIES; SUPERVISED CLASSIFICATION; SUPPORT VECTORS;

DIFFUSERS (OPTICAL);

EID: 47049116861     PISSN: 19324553     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTSP.2008.923843     Document Type: Article

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