Sensing with porous silicon double layers: A general approach for background suppression

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 4, Issue 6, 2007, Pages 2088-2092

  Pacholski, Claudia ^a   Sailor, Michael J ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Department of Chemistry and Biochemistry ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED SURFACE; BACKGROUND SUPPRESSION; BIO SENSOR; DETECTION OF BIOMOLECULES; DOUBLE LAYERS; EXPERIMENTAL ERRORS; FFT SPECTRUM; FOURIER; GENERAL APPROACH; INTENSITY RATIOS; INTERFERENCE SPECTRUM; ONE-DIMENSIONAL; OPTICAL-; REFLECTIVITY SPECTRUM; RUGATE FILTERS; SILICON FILMS; SILICON INTERFACES; SILICON PHOTONIC CRYSTALS; STOP BANDS;

ADSORPTION; BIOMOLECULES; CEMENTS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; FAST FOURIER TRANSFORMS; FOURIER TRANSFORMS; MOLECULAR BIOLOGY; MOLECULES; NONMETALS; PHOTONIC CRYSTALS; PHOTONIC DEVICES; PHOTONICS; POROUS SILICON; POWDERS; REFLECTION; SEMICONDUCTING SILICON COMPOUNDS; SIGNAL TO NOISE RATIO; SILICON; SILICON ON INSULATOR TECHNOLOGY; SPECTRUM ANALYSIS;

SURFACE ANALYSIS;

EID: 46749145045     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200674381     Document Type: Conference Paper

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