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Volumn 53, Issue 3, 2008, Pages 530-536
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Crystal structure refinement from electron diffraction data
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALLOGRAPHY;
DIFFRACTION;
ELECTRON DIFFRACTION;
ELECTRONS;
POWDERS;
SINGLE CRYSTALS;
CRYSTAL STRUCTURE REFINEMENT;
ELECTRON DIFFRACTION DATA;
INDIVIDUAL (PSS 544-7);
MULTIBEAM (CO);
POLYCRYSTALLINE FILMS;
SPECIFIC FEATURES;
WAVE METHOD;
CRYSTAL STRUCTURE;
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EID: 46749123956
PISSN: 10637745
EISSN: None
Source Type: Journal
DOI: 10.1134/S1063774508030255 Document Type: Article |
Times cited : (17)
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References (22)
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