Quantitative image correction and calibration for confocal fluorescence microscopy using thin reference layers and SIPchart-based calibration procedures

Journal of Microscopy

Volumn 231, Issue 1, 2008, Pages 59-69

  Zwier, J M ^a,c   Oomen, L ^b   Brocks, L ^b   Jalink, K ^b   Brakenhoff, G J ^a  

^a UNIVERSITY OF AMSTERDAM   (Netherlands)

^b NETHERLANDS CANCER INSTITUTE   (Netherlands)

^c HTRF Bioassays   (France)

Author keywords

3D microscopy; Confocal microscopy; Fluorescence microscopy; Image correction; Sectioned imaging; Sectioning microscopy; Shading correction; SIPcharts

Indexed keywords

FLUORESCENCE; FLUORESCENCE MICROSCOPY; MICROSCOPES; OPTICAL TRANSFER FUNCTION;

3-D MICROSCOPY; IMAGE-CORRECTION; IMAGING CONDITIONS; INTENSITY IMAGES; MICROSCOPE SYSTEMS; REFERENCE LAYER; SECTIONED IMAGING; SECTIONING MICROSCOPY; SHADING CORRECTION; SIPCHART;

CALIBRATION;

ARTICLE; CALIBRATION; CONFOCAL MICROSCOPY; DATA COLLECTION METHOD; FLUORESCENCE MICROSCOPY; IMAGE ANALYSIS; IMAGE INTENSIFIER; PRIORITY JOURNAL; QUANTITATIVE STUDY;

EID: 46749122323     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.02017.x     Document Type: Article

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