Characterization of uniform ultrathin layer for z-response measurements in three-dimensional section fluorescence microscopy

Journal of Microscopy

Volumn 225, Issue 1, 2007, Pages 88-95

  Vicidomini, G ^a   Schneider, M ^b   Bianchini, P ^a   Krol, S ^a   Szellas, T ^c   Diaspro, A ^a,d  

^a UNIVERSITY OF GENOA   (Italy)

^b SAARLAND UNIVERSITY   (Germany)

^c Leica Microsystems CMS GmbH   (Germany)

^d FIRC INSTITUTE OF MOLECULAR ONCOLOGY   (Italy)

Author keywords

4Pi microscopy; Confocal microscopy; Optical sectioning; Shift variant system; Two photon excitation microscopy; Ultrathin uniform fluorescent PE layer; Z response

Indexed keywords

ABERRATIONS; FLUORESCENCE; IMAGING SYSTEMS; PHOTONS; POLYELECTROLYTES; REAL TIME SYSTEMS;

4PI MICROSCOPY; OPTICAL SECTIONING; SHIFT-VARIANT; SHIFT-VARIANT SYSTEM; TWO-PHOTON EXCITATION MICROSCOPIES; ULTRA-THIN; ULTRATHIN LAYERS; ULTRATHIN UNIFORM FLUORESCENT PE LAYER; VARIANT SYSTEM; Z-RESPONSE;

FLUORESCENCE MICROSCOPY;

GLASS; POLYELECTROLYTE;

ARTICLE; BLEACHING; CALIBRATION; CONFOCAL MICROSCOPY; FLUORESCENCE; FLUORESCENCE MICROSCOPY; IMAGING SYSTEM; LASER MICROSCOPE; LASER MICROSCOPY; PRIORITY JOURNAL; THREE DIMENSIONAL IMAGING;

EID: 33846833462     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2007.01718.x     Document Type: Article

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